A Study on Performance Evaluation of Prototype X-ray Backscatter Imaging Device for Discrimination of Low-Density Materials

Abstract

The backscatter X-ray imaging device demonstrates excellent capability in distinguishing low-density materials. Currently, we are developing a prototype of the backscatter X-ray imaging device and evaluating its performance to enhance the device further. To confirm the performance of the developed prototype and to find additional improvement directions, we utilized three testing methods. The first and second test methods utilized for performance evaluation are the assessment of Cu wire detection capability and the evaluation of spatial resolution through slit measurement specified in ANSI N42.46. The measurements revealed that wires up to 2mm in diameter could be detected, and a resolution of 7mm line pairs could be achieved. Furthermore, to evaluate the material. discrimination capability, we tested the measurement capabilities on 16 types of materials. It was confirmed that the device could distinguish between high-density and low-density materials, with particularly high discrimination ability for aluminum. Overall, we were able to verify the performance level of the backscatter X-ray imaging device under development and obtain foundational data to determine development directions for achieving improved performance in the future.