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A Study on Performance Evaluation of Prototype X-ray Backscatter Imaging Device for Discrimination of Low-Density Materials

Authors
Jeonghee LeeJongwon ParkChanghwy LimYoungchul Choi
Issue Date
28-Oct-2024
URI
https://www.kriso.re.kr/sciwatch/handle/2021.sw.kriso/10856
Place
미국
미국(Tampa)
metadata.conference.dc.citation.conferenceName
IEEE NSS MIC RTSD 2024
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